Webinars 2011

3D-IC Test: CMC Technical Webinar Series


This virtual technical forum will offer presentations from leading experts in 3D-IC design and manufacturing, design-for-test (DFT) and built-in self test. These topics will be critical to the realization of the potential of 3D-IC to transform the world of embedded systems.  It will also give researchers who hold a CMC Subscription the opportunity to participate interactively in an ongoing CMC project for the development of a testable reference design of a 3D chip stack, manufactured in partnership with Tezzaron, and employing a state-of-the-art mixed-signal DFT approach.