Application Note: Laser Diode Testing: L-I-V Curves
Introduction to L-I-V laser diode testing available at the APSL at Queen’s University in Kingston, Ontario
Minimum Subscription Required:
Prepared by Patricia Greig, Photonics Lab Engineer, CMC Microsystems.
This application note is an introduction to L-I-V laser diode testing available at the Advanced Photonics Systems Lab (APSL) at Queen’s University in Kingston, Ontario. The techniques, supplies and basic equipment discussed here are universally applicable whether you have purchased your device from a commercial supplier, or have designed your own device and had it fabricated.
All CMC Microsystem account holders with a Prototyping or Designer Subscription are authorized to access this application note. For more information contact Linda Dougherty at firstname.lastname@example.org or 613-530-4787.
|Introduction Date:||March 31, 2009|
|Last Updated:||January 28, 2011|
|Delivery Method:||CMC Download|
|Client Access:||CMC Download|