Application Note: Laser Diode Testing: L-I-V Curves

Access Requirements

Introduction to L-I-V laser diode testing available at the APSL at Queen’s University in Kingston, Ontario

Application Note: Laser Diode Testing: L-I-V Curves

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Product Details

Description

Product Description

Prepared by Patricia Greig, Photonics Lab Engineer, CMC Microsystems.

 

This application note is an introduction to L-I-V laser diode testing available at the Advanced Photonics Systems Lab (APSL) at Queen’s University in Kingston, Ontario. The techniques, supplies and basic equipment discussed here are universally applicable whether you have purchased your device from a commercial supplier, or have designed your own device and had it fabricated.

 

All CMC Microsystem account holders with a Prototyping or Designer Subscription are authorized to access this application note. For more information contact Linda Dougherty at licensing@cmc.ca or 613-530-4787.

 

 

Support

Support Information
Product Specialist:
Version:1.0
Status:Released
Introduction Date:March 31, 2009
Last Updated:January 28, 2011
Support Level:Supported
Delivery Method:CMC Download
Client Access:CMC Download