High Voltage RF MEMS Device Testing

Test Description

This test characterizes the RF performance of high-voltage and high-frequency MEMS devices. Using high-voltage DC blocks, bias-tees, and parametric analysis test equipment, the ARFSL supports parametric characterization, e.g., impedance and inductance, of RF and low frequency MEMS components.


Principal Equipment Involved

  • Test-specific equipment
  • High-voltage DC Blocks
  • High-voltage Bias Tees


Sample Constraints

Voltage limits to be specified.


Access Options

   Local Test
   Remote Test