Keithley 4200-SCS Parameter Analyzer

Characterize semiconductor devices at the die or packaging level. With high resolution and high accuracy, this instrument is ideal for low and ultra low current measurements, current versus voltage (IV) measurements of photovoltaic cells, and pulse IV (PIV) measurements of CMOS transistors.

photo of Keithley 4200-SCS Parameter Analyzer

What’s Included

Keithley 4200-SCS Parameter Analyzer
4200-PA Remote Pre-Amp
Remote Bias Tee
BNC to BNC cables
Anti-static wrist strap
Tool kit
Power cord

System Specifications​

  • Four independent 2 W, 200 V, 100 mA source measure units (SMU), with voltage and current resolution down to 5 mV and 5 pA, respectively.
  • Four independent preamplifiers with extended low current capabilities, with resolution down to 10 aA.
  • Dual-channel digital storage oscilloscope, with a 0.5-1 GHz bandwidth and up to 2.5 GS/s sampling rate, 1 Mega-Samples on-board memory buffer.
  • 50 MHz dual-channel pulse generator for pulsed IV testing, offering up to 80 Vpp into 1 Megaohm and programmable pulse width, duty cycle, rise and fall time, amplitude, and offset.
  • The instrument is operated from a PC-based Windows XP Pro operating system, and features Keithley’s KITE software for measurement configuration.

Rent from CMC​

  • Request this equipment on a short-term loan basis.
  • Click here to complete the rental application.

Open source design platforms for accelerated system development.

Scroll to Top
Skip to content