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Keithley 4200-SCS Parameter Analyzer

Characterize semiconductor devices at the die or packaging level. With high resolution and high accuracy, this instrument is ideal for low and ultra low current measurements, current versus voltage (IV) measurements of photovoltaic cells, and pulse IV (PIV) measurements of CMOS transistors.

Specifications​

  • Four independent 2 W, 200 V, 100 mA source measure units (SMU), with voltage and current resolution down to 5 mV and 5 pA, respectively.
  • Four independent preamplifiers with extended low current capabilities, with resolution down to 10 aA.
  • Dual-channel digital storage oscilloscope, with a 0.5-1 GHz bandwidth and up to 2.5 GS/s sampling rate, 1 Mega-Samples on-board memory buffer.
  • 50 MHz dual-channel pulse generator for pulsed IV testing, offering up to 80 Vpp into 1 Megaohm and programmable pulse width, duty cycle, rise and fall time, amplitude, and offset.
  • The instrument is operated from a PC-based Windows XP Pro operating system, and features Keithley’s KITE software for measurement configuration.

What’s Included

  • Keithley 4200-SCS Parameter Analyzer
  • 4200-PA Remote Pre-Amp
  • Remote Bias Tee
  • BNC to BNC cables
  • Keyboard
  • Anti-static wrist strap
  • Mouse
  • Tool kit
  • Power cord

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