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MIP Micromirror Variant

The MIP Micromirror variant bridges the gap between algorithmic/analysis and stimulus, and measurement of MEMS micromirror sensors. It presents a modular, desktop environment for MEMS micromirror and electronics device integration and validation in a system context. 

The MIP Micromirror variant has a PXIe-based control system, which includes a system-level design environment, data acquisition, FPGA based signal/control processing and signal conditioning, as well as Micromirror fixtures or interface boards for Micromirror device characterization and measurement. 

Benefits

  • Accelerates research by providing a feature-rich platform for integration and validating of micromirror-based microsystems.
  • Addresses specific research needs through a graphics-based programmable environment and micromirror sensors and actuator interfaces boards.
  • Enables a faster path to commercialization by sourcing commercial-grade components and through compliance with commercial standards and interfaces (e.g., PXI and PXIe).

Applications

Suitable research filed for this variant includes real-time control of MEMS micromirror devices in either open-loop or close loop operation. A research example of using it is shown below:

Research Example of MIP Micromirror Variant
Research Example of MIP Micromirror Variant

 

Features

NI PXI-express Chassis
NI PXI-express Chassis

PXI-express base, which includes:

  • System controller
  • PXIe expansion card slots, including high-end FPGA-based DAQ, high-resolution digitizer, arbitrary waveform generator, digital multimeter, and high-accuracy power measurement unit Program environment: LabVIEW, C/C++
  • High-voltage amplifier and various of high-voltage fixtures, as well as interface boards and test chips
  • Optical components including laser sources, position sensor and amplifier, beam splitter, lens, and holding board.

How to Access

Susan Xu
Senior Engineer, System-Level Integration
Phone: +1.613.530.4692
E-mail Susan Xu

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