LAB

Test Fixtures & User Guides

Whether you are characterizing your device at the chip, package or system level, a fixture is an important part of the test set-up and has an important role to play in optimizing your signal integrity. CMC offers a range of test fixtures for purchase, corresponding to many popular microelectronic package footprints.

Test Fixtures

NameSummary
Fixture: RF Test FixtureThis fixture clamps to microstrip or CPW lines at the edge of an RF board and is usable at any position without limit on size of circuit. The base is magnetic and it can be locked and released by a knob to accommodate any kinds of circuit configuration. Available for frequency ranges up to 40 GHz.
Fixture: MEMS Interface Board for MIP and Smart-FixtureThis is a PCB Fixture Interface Board that connects to the Microsystems Integration Platform (MIP), 7854R, MEMs variant, and the National Instruments Single Board RIO (sbRIO-9636) for PGA68 packaged designs.
Fixture: CMC Interface Board for iNEMOCMC has designed a serial peripheral interface (SPI) extension board that expands iNEMO’s connectivity via its SPI interface on the extended connector.
Fixture: CQFP80 to SMAPCB-based test fixture to interface a CQFP80-packaged device to SMA connectors
Fixture: CMC Interface Board for STM iNEMO Sensor Module (SPI Extension)CMC Interface board containing A/D conversion, GPIO expansion and DC/DC voltage conversion for the use with STM iNEMO.
Fixture: Generic Micromirror Test Fixture for MEMS Research and PrototypingThe Generic Micromirror Test Fixture is a technology-evaluation and development tool that allows researchers to rapidly and efficiently implement their micromirror technology in a proof-of-concept system-level prototyping environment.
Fixture: CFP80 Package, High Speed (RF)PCB fixture that interfaces a CFP80 packaged device to SMA connectors, for RF testing
Fixture: CFP24 Package, RFPCB fixture that interfaces a CFP24 packaged device to SMA connectors, for RF testing
Fixture: DIP 40 Package, High VoltagePCB fixture that interfaces a DIP40 packaged device to header pins, high voltage
Fixture: PGA68 Package, High VoltagePCB fixture that interfaces a PGA68 packaged device to header pins, high voltage
Fixture: PGA84 Package, High VoltagePCB fixture that interfaces a PGA84 packaged device to header pins, high voltage
Fixture: PGA68 Package, MEMS/FPGA Mixed-Signal PrototypingPCB fixture that interfaces a PGA68 packaged device to header pins and BNC connectors, high voltage
Fixture: CQFP44 Package, Clamshell SocketPCB fixture that interfaces a CQFP44 packaged device to header pins; clamshell quick release socket
Fixture: CFP80 Package, Clamshell SocketPCB fixture that interfaces a CFP80 packaged device to header pins; clamshell quick release socket
Fixture: CQFP120 Package, Clamshell SocketPCB fixture that interfaces a CFP120 packaged device to header pins; clamshell quick release socket

User Guides

NameSummary
Product Description: emSYSCAN Test Fixtures (ICI-297)Guide to CMC-supported test fixtures
Quick Start Guide: Editing Verigy93000 Test Fixture Layout Using Cadence Allegro PCB Layout Editor (ICI-260)Instructions on editing CMC test fixtures using Cadence Allegro
User Guide: Generic Micromirror Test Fixture for MEMS Research and Prototyping (ICI-256)This document provides a functional overview and basic guide for using the Generic Micromirror Test Fixture for MEMS Research and Prototyping.
User Guide: Ceramic Flat Package 24-pin Test Fixture (CFP24TF) (ICI-230)This user guide provides information on the use of the CFP24TF fixture.
User Guide: High Speed Fixture for Testing CQFP120 Packages on the Verigy 93000 Tester (ICI-236)The instructions on how to obtain and configure the High Speed CQFP120 DUT Board (HiSTF) available through the NMPTC
User Guide: Printed Circuit Board Test Fixture for 44-Pin CFP Package Using a Clamshell Socket (ICI-239) 
User Guide: Ceramic Flat Package (CFP) 80-pin Test Fixture (ICI-097)A user guide describes usage of the test fixture.
User Guide: CQFP80-SMA Test Fixture (ICI-291)This user guide describes usage of a fixture for testing CQPF80-packaged electronic devices.

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