Characterization of electronic devices is a critical step in understanding and engineering novel devices. Using electron and ion microscopy, material can be characterized from the micron to atomic scale with the ability to pin-point regions of interests, such as key deposition layers, growth interfaces, or failure locations. This webinar will provide details of the services, instrumentation, and characterization methods available to CMC users through the Canadian Centre for Electron Microscopy (CCEM), a facility supported through the MNT Award. Learn how CCEM is increasing its national accessibility through services and funding opportunities.
Presented by Dr, Andres Korinek, CCEM Executive Director and electron microscopist.
