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Keysight 86100D Infiniium DCA-X Digital Communication Analyzer Mainframe, Modules TDR/TDT and 70GHz RF Oscilloscope

The Keysight DCA-X mainframe from the CMC test equipment pool is part of a modular system for the analysis of time domain broadband signals up to 70 GHz. 86100D DCA-X mainframe can be configured by selecting from a variety of plug-in modules that perform precision optical, electrical, and TDR/TDT measurements.

The mainframe comes with module 86118A (Dual 70GHz RF Heads) and module 54754A (for TDR/TDT measurements).

Photo of 86118A
Module 86118A (70GHz Sampling Oscillscope with Dual RF Heads)
Photo of Keysight 54754A
Module, Keysight M54754A (TDR/TDT):

86100D Mainframe

Specifications​

  • Front panel clock trigger
  • Software upgrades for advanced waveform study, including:
    • 86100D-200 for Timing Jitter Analysis;
    • 86100D-201 for Waveform Analysis using extended memory;
    • 86100D-300 for Amplitude Analysis/Relative Intensity Noise (RIN)/Quality Factor; and
    • 86100D-SIM for Enhanced Waveform Analysis.
  • Remote connection via Ethernet or GPIB using Keysight IO software

Applications

  • Broadband data capture supported with real-time MATLAB analysis
  • Jitter component analysis and eye diagram closure root cause
  • De-embedding of digital designs to characterize high-speed circuitry

Module 86118A 70 GHz RF Sampling 

Oscilloscope Specifications

  • Frequency range to 70 GHz
  • Two (2) RF/microwave inputs for single-ended or differential measurements
  • 50-ohm inputs
  • Two-meter inbuilt cables extend the reach of the RF/microwave heads

86118A Applications

  • High-frequency time domain oscilloscope
  • Eye Diagram Analysis

Module 54754A Time Domain Reflectometry

Transmission Specifications

  • Frequency range to 18.5 GHz
  • Inputs can be configured for single-ended, common-mode or differential measurements
  • Input limit is +/- 2 Vdc

54754A Applications

  • Time domain measurements for sub-circuit network modelling
  • Signal integrity analysis
  • Determination of circuit transmission and reflection coefficients
  • Characterize materials for loss tangent or traces for impedance mismatch

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James Millar
Technical Staff, Embedded Systems Design
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