The Agilent N5242A 10 MHz-to-26.5 GHz PNA-X Vector Network Analyzer is an integrated test system for complete linear and non-linear characterization of RF and microwave components and devices with a single set of connections. The analyzer is a four-port, double-source instrument. It features an internal signal combiner, internal pulse modulators and internal noise receivers. The advanced architecture and re-configurable measurement paths make Agilent N5242A a replacement for bench top instruments such as network analyzer, spectrum analyzer, signal source, and power meter. The potential research applications include wireless communications, high speed links, material characterization, and life sciences. The analyzer comes with a number of automated applications such as linear and non-linear network analysis, the latter features X parameters measurements, time domain measurements, IMD (Intermodulation Distortion), and Gain compression measurements. The analyzer runs Windows XP Pro operating system and can be remotely accessed via LAN.
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AVAILABLE EQUIPMENT
Agilent N5242A 10MHz – 26.5GHz PNA-X Vector Network Analyzer

What’s Included
- Agilent N5242A 10MHz – 26.5GHz PNA-X Vector Network Analyzer
- Agilent N4691B E-Cal kit
- Agilent U9391C Comb Generator (optional)
Helpful Resources
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- Datasheet and Technical Specifications
- Slides presented at the Advanced RF/Microwave Measurements Canadian Seminar Tour – March 2013:
PNA-X Test Solutions: Fast, Simple, Accurate: Modern Methods of Test for Amplifiers
- YouTube Demo: Agilent PNA-X Embedded-LO Converter Demo: How to make calibrated absolute group delay measurements of frequency converters with embedded local oscillators
- YouTube Webinar: Noise Figure Measurements with the PNA-X
Applications
- S-parameters characterization of RF/Microwave Passive Devices: filters, couplers , duplexers, isolators, and attenuators
- X-parameters characterization of RF/Microwave active devices such transistors, diodes, and amplifiers
- Characterization of mixers and frequency converters
- Antenna measurements
- Dielectrics characterization
Rent from CMC
- Request this equipment on a short-term loan basis.
- Click here to complete the rental application.