photo of Ossila probe

Ossila Four-Point Probe System

The Ossila Four-Point Probe system is a compact, single-unit probing device designed for measuring sheet resistance, resistivity and conductivity. The probe tips are spring-loaded to avoid scratching the surface of samples. Software and drivers are provided on a USB stick. The software requires a few simple inputs and calculates the sheet resistance, and optionally, conductivity and resistivity of a material with a known thickness.

Ossila Four-Point Probe System Read More »