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SMU

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Ossila Four-Point Probe System

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The Ossila Four-Point Probe system is a compact, single-unit probing device designed for measuring sheet resistance, resistivity and conductivity. The probe tips are spring-loaded to avoid scratching the surface of samples. Software and drivers are provided on a USB stick. The software requires a few simple inputs and calculates the sheet resistance, and optionally, conductivity and resistivity of a material with a known thickness.

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photo of Keithley 2400 SourceMeter

Keithley 2400 SourceMeter

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The Keithley 2400 SourceMeter is designed for applications that rely on both precision sourcing and measuring. The device combines a 20 W, four-quadrant (source and sink) IV source with an IVR digital multimeter. The Keithley 2400 can perform linear, logarithmic, and custom sweeps for single-event or continuous operation. With 1pA current and 100nV voltage measurement resolutions, the Keithley 2400 is well-equipped for basic SMU test applications.

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copy of Keysight B2902A Precision Source Measurement Unit

Keysight B2902A Precision Source Measurement Unit

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The Keysight B2902A is a two-channel SMU capable of performing precise IV measurements and acting as an arbitrary waveform generator. The GUI offers four views: single channel, dual channel, graph, and roll (I-t or V-t curves). The B2902A supports four-quadrant measurements and standard built-in sweep procedures (linear, logarithmic, single and double sweep functions) DC or pulsed.

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Photo of National Instruments RF PXIe System Including a 26-GHz VSA

National Instruments RF PXIe System Including a 26-GHz VSA

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The NI RF PXI-express system, available from the CMC Equipment Rental Program, is an 18-slot PXI-express chassis with high-speed controller (Intel quad core, 4 G memory and Dual OS), 6.6 GHz RF Vector Signal Generator, 26GHz GHz RF Vector Signal Analyzer, Source Measurement Unit, 1.5GHz Oscilloscope, 6.6GHz Vector Signal Generator. This system is an integrated, modular instrument with LabVIEW-based simulation/test environment which enables faster RF test and validation setup and experimental results.

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